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    • Hitachi High-Tech Group
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      Scanning Electron Microscope - Contact Us - FlexSEM 1000 II

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      Scios 3 FIB-SEM - Trinity Detection System

      SponsoredVersatile FIB-SEM for high throughput performance with advanced automation. Learn more! Material microstructure characterization, 3D materials analysis, & TEM sample preparation.

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    • nanoimages.com
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      Scanning Electron Microscope - Learn More

      SponsoredA Wide Range of Technologies for the Analysis of Electron Beam and Surface Image. Find Out More About Our Products and Services at Nanoimages!