We live in an era where the demand for portable and wearable devices have been increasing multifold. Products based on applications like IoT (Internet of Things), Artificial Intelligence, Virtual ...

About a dozen years ago, the world of test had reached an economic impasse: most digital designs had become sufficiently complex that standard scan testing techniques were no longer cost-effective.

With advanced technology nodes, the SoCs are growing in density and gate count. This creates challenges regarding the testability, and more importantly, the test cost. The design complexity and size ...

Each new manufacturing process generation brings with it a whole new set of challenges. In an era of multimillion-gate complexity and increasing density of nanometer manufacturing defects, a key ...

Today’s highly complex and large system on chip (SoC) devices and systems present many challenges to be addressed from manufacturing tests to the field while meeting stringent requirements for test ...