Printed-circuit-board test and inspection becomes challenging as component sizes shrink and access disappears. Solutions include design and DFT software; probes and fixtures; in-circuit, flying-probe, ...

A blue-ribbon panel at the 2006 VLSI Test Symposium in Berkeley, CA, ran deep into the night Monday exploring the future of design for testability (DFT). The primary question was whether, in the face ...

Improved testability, coupled with more tests at more insertion points, are emerging as key strategies for creating reliable, heterogeneous 2.5D and 3D designs with sufficient yield. “With chiplets, ...

Of all the electronic design automation (EDA) tools on the market, design for test (DFT) may be the most under-appreciated; even though building testability into a chip during the design phase will ...