As device sizes continue to increase on devices at 2x nm design rule and beyond and high wafer stress is worsening due to multi-film stacking in the vertical memory process, we observe an increasing ...

iMerit's defect detection application enables AI development teams to build high-precision machine learning models for fully-automated production lines on the manufacturing floor. The solution can be ...

Portable 3D optical inspection with 4Di InSpec transforms surface metrology, enhancing defect detection and quality assurance ...

Chipmakers worldwide consider Automatic Test Pattern Generation (ATPG) their go-to method for achieving high test coverage in production. ATPG generates test patterns designed to detect faults in the ...

Optical 3D metrology enables fast, non-contact surface roughness measurement of defects and roughness for precise ...

Provectron, a smart manufacturing partner focused on high-precision automation, today makes its official U.S. debut at CES in Las Vegas. Designed to support manufacturers looking to localize and ...