Obtaining reliable data from electric utilities about magnitude and duration of single-phase, line-to-ground fault currents at the service entrance of commercial and industrial facilities is of ...

As integrated circuit (IC) designs continue to scale, the demand for efficient power management, performance optimization and reliable physical layout modification grows more critical. Meeting these ...

A recent trend confusing two quite different terms has had a huge negative impact on the yield, reliability, and manufacturability of DSM (deep-submicron) and subwavelength semiconductor designs. This ...