Duke engineers show how a common device architecture used to test 2D transistors overstates their performance prospects in real-world devices.
This file type includes high resolution graphics and schematics. The spread of h FE values in a batch of transistors may be wide enough to cause unreliable performance during mass production of a ...
Morning Overview on MSN
China unveils what it claims is the tiniest, most efficient transistor ever
Researchers at Peking University have built a transistor they say is the world’s smallest and most energy-efficient, ...
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