TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951)(President & COO Izumi Oi) announces the development and release of a new scanning electron microscope (SEM), the JSM-IT510 series, in November 2021.
TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announces the release of a new scanning electron microscope (SEM), the JSM-IT700HR for unprecedentedly high throughput in ...
This instrument is an ultra-high-resolution scanning electron microscope capable of secondary-electron image resolution of 1.2 nm. It is fully digital and incorporates an image archiving computer.
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Scanning Electron Microscopy (SEM) has revolutionized the realm of microscopic analysis. By delivering astonishingly detailed images of minuscule entities such as insects, bacteria, or even the ...
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