(Nanowerk News) The roughness of a surface can make all the difference in nanoscale devices. Measuring the roughness of such delicate surfaces in the hard-to-reach places of nanodevices, however, is ...

SAN DIEGO--(BUSINESS WIRE)--Filmetrics has extended its free 3D surface-image analyzer, ProfilmOnline, to AFM and other scanning-probe applications. This cloud-based software is also ideal for ...

The S lynx from Sensofar is a new non-contact 3D surface profiler, purpose-designed as a highly compact high-performance system for both research and industrial applications. The compact and versatile ...

Profilm3D surface profiler provides sub-nanometer vertical resolution using vertical-scanning interferometry (VSI) and phase-shifting interferometry (PSI). Software capabilities include measurements ...

Please contact the ARC Core Labs for questions and assistance. Contact Us Profilm3D surface profiler provides sub-nanometer vertical resolution using vertical-scanning interferometry (VSI) and ...

The study of micro- and nanoscale surface metrology is becoming commonplace in industrial and research environments, as structures and surface features become smaller and smaller. In particular, ...

(Nanowerk News) Optical measurement techniques collecting light intensity in the far-field such as conventional and confocal microscopy or coherence scanning interferometry (CSI) enable fast and ...

The piezoelectric inkjet print heads manufactured by Fujifilm Dimatix dispense micro amounts of fluids in industrial imaging and printing applications. The company constructs its print heads using ...